Global ETD Search

291	Scanning probe microscopy investigation of bilayered manganites Huang, Junwei, January 1900 (has links) Thesis (Ph. D.)--University of Texas at Austin, 2007. / Vita. Includes bibliographical references.
292	FRET peptidyl sensors for the detection of metal ions White, Brianna Rose, January 1900 (has links) Thesis (Ph. D.)--University of Texas at Austin, 2007. / Vita. Includes bibliographical references.
293	A quantitative description at multiple scales of observation of accumulation and displacement patterns in single and dual-species biofilms Klayman, Benjamin Joseph. January 2007 (has links) (PDF) Thesis (Ph. D.)--Montana State University--Bozeman, 2007. / Typescript. Chairperson, Graduate Committee: Anne Camper. Includes bibliographical references (leaves 104-113).
294	Synthesis and STM imaging of octadecyloxy benzothiozol / Ginting, Elfrida, January 2006 (has links) Thesis (M.S.)--University of Texas at Dallas, 2006. / Includes vita. Includes bibliographical references (leaves 50-58)
295	Dual-mode reflectance and fluorescence confocal microscope for near real-time morphological and molecular imaging of tissue Carlson, Alicia Lacy, January 1900 (has links) (PDF) Thesis (Ph. D.)--University of Texas at Austin, 2006. / Vita. Includes bibliographical references.
296	Sub-wavelength optical phenomena and their applications in nano-fabrication Shao, Dongbing, January 1900 (has links) (PDF) Thesis (Ph. D.)--University of Texas at Austin, 2006. / Vita. Includes bibliographical references.
297	Physical properties of grafted polymer monolayers studied by scanning force microscopy morphology, friction, elasticity / Koutsos, Vasileios. January 1997 (has links) Proefschrift Rijksuniversiteit Groningen. / Datum laatste controle: 23-10-1997. Lit.opg. - Met een samenvatting in het Nederlands.
298	Concepts of interactions in local probe microscopy Kerssemakers, Jacob Willem Jozef. January 1997 (has links) Proefschrift Rijksuniversiteit Groningen. / Datum laatste controle: 22-12-1997. Met bibliogr., lit. opg. - Met samenvatting in het Nederlands.
299	Electron microsscopy of mixed uranium oxide Pienkowski, Marian Czeslaw January 1989 (has links) No description available. 546 Uranium oxides ; Electron microscopy
300	Electric force microscopy techniques on GaAs mesoscopic structures / Lanzoni, Evandro Martin. January 2018 (has links) Orientador: Elidiane Cipriano Rangel / Coorientador: Christoph Friendrich Deneke / Banca: José Roberto Ribeiro Bortoleto / Banca: Ricardo Paupitz Barbosa dos Santos / Resumo: As técnicas de microscopia de sonda Kelvin (KPFM) e de microscopia de força eletrostática (EFM) são amplamente utilizadas para analisar a distribuição do potencial de superfície, porém com pouca aplicação em nanoestruturas semicondutoras auto-organizadas embutidas em um substrato. Neste trabalho, investigamos diretamente o acúmulo de carga dentro de estruturas mesoscópicas de GaAs (MGS) [1]. As estruturas são fabricadas através do crescimento sobreposto de um modelo de nano orifícios usando epitaxia de feixe molecular. Para tal, uma combinação de desoxidação assistida por Ga e ataque químico por gotículas localizadas foram utilizadas para criar orifícios iniciais com uma profundidade de ca. 10 a 15nm, que são posteriormente cobertos com 15nm de barreira AlxGax-1As e GaAs com 1nm, 2nm, 5nm, 10nm de espessura. Microscopia de força atômica e microscopia eletrônica de transmissão mostraram que a forma do orifício é preservada durante o crescimento de AlGaAs. Em seguida, esses orifícios são preenchidos com GaAs formando uma estrutura alongada sobre o buraco [1]. Investigamos o potencial de superfície local e a distribuição das cargas nestas estruturas com a técnica KPFM de passagem única. Portanto, uma voltagem AC de 5 V é aplicada a uma ponta metalizada e varremos a amostra no modo de contato intermitente. Observamos uma clara diferença de potencial na região central da estrutura, onde esperamos o furo preenchido. Então, um estudo sistemático com a técnica de KPFM mostrou a influ... (Resumo completo, clicar acesso eletrônico abaixo) / Abstract: Kelvin probe force microscopy and electric force microscopy techniques are widely used to analyze the distribution of the surface potential with little application to self-assembled semiconductor nanostructures embedded into a substrate. In this work, we directly investigate the charge accumulation inside mesoscopic GaAs structures [1]. The structures are fabricated by overgrowth of a nanohole template using molecular beam epitaxy. Therefore, a combination of Ga assisted deoxidation and local droplet etching is used to create initial holes with a depth of ca. 10 to 15nm, which are covered subsequently with 15nm of AlxGax-1As barrier and GaAs caps with 1nm, 2nm, 5nm, 10nm thicknesses. Atomic force microscopy and transmission electron microscopy results showed that the hole shape is preserved during the AlGaAs overgrowth. Then filled with GaAs forming an elongated mount over the hole [1]. We investigate the local potential and the charge distribution in these structures with a single pass Kelvin probe force microscopy technique. Therefore, an AC voltage of 5 V is applied to a metalized tip and scanned in tapping mode over the sample. We observed a clear potential difference in Kelvin probe force microscopy measurements in the middle of the structure, where we expect a filled hole. We systematically study by Kelvin probe force microscopy the influence on the charge accumulation when the GaAs thickness is changed, as well as the Al concentration in the AlGaAs barrier. Calculation... (Complete abstract click electronic access below) / Mestre Microscopia. Nanoestruturas. Semicondutores. Eletrostatica. Microscopy.

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