The dissertation thesis with the topic „Simulation Modelling of Electrical Drives for Selected Critical Applications“ focuses on the area of given applications in civil aviation. The selected application that the thesis deals with is an electrically driven and electronically controlled fuel pump supplying fuel to an aviation motor of the APU type. The thesis gives a comprehensive description of the design cycle of the unit and demonstrates implementing all the required critical functions. In the course of the design of the unit modern techniques in mathematical modelling, simulation, verification, monitoring and prediction of the operation status of airborne equipment were uses to the utmost extent. The purpose of these was to show the suitability of their application with regard to decreasing design time and cost, increasing lifetime and servicing intervals, as well as increasing user comfort and decreasing price. At the same time the required reliability was to be kept. The thesis also aims to prove and verify the suitability of using electronically commutated dc motors in critical applications in civil aviation. To reach this goal, it is necessary to design a robust drive control which would meet the given reliability requirements.

Les technologies de transistors bipolaires à hétérojonctions (HBT) ont montré leur efficacité pour permettre aux circuits de traiter les grands signaux au delà de 100Gbit/s pour les réseaux optiques Ethernet. Pour assurer ce résultat, une bonne fiabilité doit être garantie. Des tests de vieillissements accélérés sous contraintes thermiques et électrothermiques sont réalisés et analysés avec les outils de simulation physique Sentaurus TCAD afin d’obtenir les lois de vieillissement physiques. Le modèle compact HICUM niveau 2, basé sur la physique, est utilisé pour modéliser précisément le composant avant vieillissement, puis pour ajuster les caractéristiques intermédiaires pendant le vieillissement. L’évolution des paramètres du modèle est décrit avec des équations appropriées pour obtenir un modèle électrique compact du vieillissement basé sur la physique. Les lois de vieillissement et les équations d’évolutions des paramètres avec le temps de contrainte sont implantées dans le modèle électrique de vieillissement en langage Verilog-A, ce qui permet de simuler l’impact des mécanismes de défaillances sur le circuit en conditions opérationnelles. / Modern InP Heterojunction Bipolar Transistors (HBT) technology has shown its efficiency for making large signal ICs working above 100 Gbits/s for Ethernet optical transport network. To full-fill this expectation, a good reliability has to be assured. Accelerated aging tests under thermal and electro-thermal stress conditions are performed and analyzed with Sentaurus TCAD device simulation tools to achieve the physical aging laws. The physics based advanced bipolar compact model HICUM Level 2 is used for precise modeling of the devices before aging. The HICUM parameters are extracted to fit the intermediate characterizations during aging. The evolution of the model parameters is described with suitable equations to achieve a physics based compact electrical aging model. The aging laws and the parameter evolution equations with stress time are implemented in compact electrical aging model in Verilog-A languages which allows us to simulate the impact of device failure mechanisms on the circuit in operating conditions.