Hot carrier effects in sub-micron lightly doped drain (LDD) n-channel MOSFETs under static (DC) stress are studied in order to establish the degradation mechanisms of such devices. Degradation is monitored as a function of time at various gate voltages. Under accelerated aging conditions (i.e. large drain voltages) the gate voltage for maximum degradation is found to be different than the gate voltage for which the substrate current is maximum; this is in contrast to the results of previous workers who found degradation and substrate current to be strongly correlated. However, under normal operating conditions, degradation and substrate current are found to be correlated. Furthermore, through the use of charge pumping measurements it is shown that two primary mechanisms are accountable for the degradation of these devices at small and large gate voltages. First, at large gate voltages there is an increase in the degradation which is predominantly due to electron injection and trapping in the oxide. An alternating static injection experiment shows that this type of electron trapping degradation is recoverable. Second, at small gate voltages degradation is mainly related to interface state generation near the drain LDD region. Floating gate measurements demonstrate that electron and hole injection occurs at large and small gate voltages, respectively. It is also shown that maximum interface state creation occurs when electron and hole injection happens simultaneously. / Graduation date: 1994

Thesis (Ph. D.)--University of Adelaide, 1984. / Some mounted ill. Includes bibliographical references (leaves 156-186).

Thesis (Ph. D.)--University of Adelaide, Department of Plant Pathology, 1985. / Includes bibliographical references (leaves 62-64).

Thesis (Ph.D.)--Pennsylvania State University, 2007. / Mode of access: World Wide Web.

Thesis (Ph.D.)--York University, 2006. Graduate Programme in Mathematics and Statistics. / Typescript. Includes bibliographical references (leaves 126-132). Also available on the Internet. MODE OF ACCESS via web browser by entering the following URL: http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&res_dat=xri:pqdiss&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&rft_dat=xri:pqdiss:NR19847

Thesis (Ph.D.)--Murdoch University, 2006. / Thesis submitted to the Division of Health Sciences. Bibliography: leaves 225-252.

Thesis (M.S.)--Virginia Polytechnic Institute, 1961. / Vita. Abstract. Includes bibliographical references (leaves 54-59). Also available via the Internet.

Univ., Diss--Mannheim, 2006. / Literaturverz. S. 281 - 297.

Thesis (Ph. D.)--Ohio State University, 2008.

Thesis (M.S.)--California Polytechnic State University, 2009. / Mode of access: Internet. Title from PDF title page, viewed on March 30, 2009. Major professor: Michael J. Costello, Ph.D. "Presented to the Electrical Engineering Department Faculty of California Polytechnic State University, San Luis Obispo." "In partial fulfillment of the requirements for the degree [of] Master of Science in Agriculture, with specialization in Plant Protection Science." March 2009." Includes bibliographical references (p. 48-54). Will also be available on microfiche.