abstract: Several state of the art, monitoring and control systems, such as DC motor controllers, power line monitoring and protection systems, instrumentation systems and battery monitors require direct digitization of a high voltage input signals. Analog-to-Digital Converters (ADCs) that can digitize high voltage signals require high linearity and low voltage coefficient capacitors. A built in self-calibration and digital-trim algorithm correcting static mismatches in Capacitive Digital-to-Analog Converter (CDAC) used in Successive Approximation Register Analog to Digital Converters (SARADCs) is proposed. The algorithm uses a dynamic error correction (DEC) capacitor to cancel the static errors occurring in each capacitor of the array as the first step upon power-up and eliminates the need for an extra calibration DAC. Self-trimming is performed digitally during normal ADC operation. The algorithm is implemented on a 14-bit high-voltage input range SAR ADC with integrated dynamic error correction capacitors. The IC is fabricated in 0.6-um high voltage compliant CMOS process, accepting up to 24Vpp differential input signal. The proposed approach achieves 73.32 dB Signal to Noise and Distortion Ratio (SNDR) which is an improvement of 12.03 dB after self-calibration at 400 kS/s sampling rate, consuming 90-mW from a +/-15V supply. The calibration circuitry occupies 28% of the capacitor DAC, and consumes less than 15mW during operation. Measurement results shows that this algorithm reduces INL from as high as 7 LSBs down to 1 LSB and it works even in the presence of larger mismatches exceeding 260 LSBs. Similarly, it reduces DNL errors from 10 LSBs down to 1 LSB. The ADC occupies an active area of 9.76 mm2. / Dissertation/Thesis / Doctoral Dissertation Electrical Engineering 2014

With the downscaling trend in CMOS technology, it has been possible to utilize the advantages of high element densities in VLSI circuits and systems. This trend has readily allowed digital circuits to predominate VLSI implementations due to their ease of scaling. However, high element density in integrated circuit technology has also entailed a decrease in the power consumption per functional circuit cell for the use of low-power and reconfigurable systems in portable equipment. Analog circuits have the advantage over digital circuits in designing low-power and compact VLSI circuits for signal processing systems. Also, analog circuits have been employed to utilize the wide dynamic range of the analog domain to meet the stringent signal-to-noise-and-distortion requirements of some signal processing applications. However, the imperfections and mismatches of CMOS devices can easily deteriorate the performance of analog circuits when they are used to realize precision and highly linear elements in the analog domain. This is mainly due to the lack of tunability of the analog circuits that necessitates the use of special trimming or layout techniques. These problems can be alleviated by making use of the analog storage and capacitive coupling capabilities of floating-gate transistors. In this research, tunable resistive elements and analog storages are built using floating-gate transistors to be incorporated into signal processing applications. Tunable linearized resistors are designed and implemented in CMOS technology, and are employed in building a highly linear amplifier, a transconductance multiplier, and a binary-weighted resistor digital-to-analog converter. Moreover, a tunable voltage reference is designed by utilizing the analog storage feature of the floating-gate transistor. This voltage reference is used to build low-power, compact, and tunable/reconfigurable voltage-output digital-to-analog converter and distributed arithmetic architecture.

The advent of deep submicron technology has resulted in a new generation of highly integrated mixed-signal system-on-chips (SoCs) and system-on-packages (SoPs). As a result, the cost of electrical products has sharply declined, and their performance has greatly improved. However, a testing throughput still remains one of the major contribution factors to final cost of the electrical products. In addition, highly precise and robust test methods and equipment are needed to promise non-defective products to customers. Hence, the testing is a critical part of the manufacturing process in the semiconductor industry. Testing such highly integrated systems and devices requires high-performance and high-cost equipment. Analog-to-digital converters (A/D converters) are the largest volume mixed-signal circuits, and they play a key role in communication between the analog and digital domains in many mixed-signal systems. Due to the increasing complexity of the mixed-signal systems and the availability of the new generations of highly integrated systems, reliable and robust data conversion schemes are necessary for many mixed-signal designs. Many applications such as telecommunications, instrumentation, sensing, and data acquisition have demanded data converters that support ultra high-speed, wide-bandwidths, and high-precision with excellent dynamic performance and low-noise. However, as resolutions and speeds in the A/D converters increase, testing becomes much harder and more expensive. In this research work, low-cost test strategies to reduce overall test cost for high-precision A/D converters are developed. The testing of data converters can be classified as dynamic (or alternating current (AC)) performance test and static (or direct current (DC)) performance test [1]. In the dynamic specification test, a low-cost test stimulus is generated using an optimization algorithm to stimulate high-precision sigma-delta A/D converters under test. Dynamic specifications are accurately predicted in two different ways using concepts of an alternate-based test and a signature-based test. For this test purpose, the output pulse stream of a sigma-delta modulator is made observable and useful. This technique does not require spectrally pure input signals, so the test cost can be reduced compared to a conventional test method. In addition, two low-cost test strategies for static specification testing of high-resolution A/D converters are developed using a polynomial-fitting method. The cost of testing can be significantly reduced as a result of the measurement of fewer samples than a conventional histogram test. While one test strategy needs no expensive high-precision stimulus generator, which can reduce the test cost, the other test strategy finds the optimal set of test-measurement points for the maximum fault coverage, which can use minimum-code measurement as a production test solution. The theoretical concepts of the proposed test strategies are developed in software simulation and validated by hardware experiments using a commercially available A/D converter and designed converters on printed circuit board (PCB). This thesis provides low-cost test solutions for the high-resolution A/D converters.

This diploma thesis deals with the design of eight-bit digital to analog coverter with fully differential outputs in technology I3T25 of ON Semiconductor company. The work contains the description of basic structures and characteristics of digital to analog converters. The main focus of the work is to design a converter and auxiliary circuits at the transistor level. The functionality of designed circuits is verified by simulation environment Cadence.

Delta-Sigma (ΔΣ) analog-to-digital converters (ADCs) are traditionally used in high quality audio systems, instrumentation and measurement (I&M) and biomedical devices. With the continued downscaling of CMOS technology, they are becoming popular in wideband applications such as wireless and wired communication systems,high-definition television and radar systems. There are two general realizations of a ΔΣ modulator. One is based on the discrete-time (DT) switched-capacitor (SC) circuitry and the other employs continuous-time (CT) circuitry. Compared to a CT structure, the DT ΔΣ ADC is easier to analyze and design, is more robust to process variations and jitter noise, and is more flexible in the multi-mode applications. On the other hand, the CT ΔΣ ADC does not suffer from the strict settling accuracy requirement for the loop filter and thus can achieve lower power dissipation and higher sampling frequency than its DT counterpart. In this thesis, both DT and CT ΔΣ ADCs are investigated. Several design innovations, in both system-level and circuit-level, are proposed to achieve lower power consumption and wider signal bandwidth. For DT ΔΣ ADCs, a new dynamic-biasing scheme is proposed to reduce opamp bias current and the associated signal-dependent harmonic distortion is minimized by using the low-distortion architecture. The technique was verified in a 2.5MHz BW and 13bit dynamic range DT ΔΣ ADC. In addition, a second-order noise coupling technique is presented to save two integrators for the loop filter, and to achieve low power dissipation. Also, a direct-charge-transfer (DCT) technique is suggested to reduce the speed requirements of the adder, which is also preferable in wideband low-power applications. For CT ΔΣ ADCs, a wideband low power CT 2-2 MASH has been designed. High linearity performance was achieved by using a modified low-distortion technique, and the modulator achieves higher noise-shaping ability than the single stage structure due to the inter-stage gain. Also, the quantization noise leakage due to analog circuit non-idealities can be adaptively compensated by a designed digital calibration filter. Using a 90nm process, simulation of the modulator predicts a 12bit resolution within 20MHz BW and consumes only 25mW for analog circuitry. In addition, the noise-coupling technique is investigated and proposed for the design of CT ΔΣ ADCs and it is promising to achieve low power dissipation for wideband applications. Finally, the application of noise-coupling technique is extended and introduced to high-accuracy incremental data converters. Low power dissipation can be expected. / Graduation date: 2010

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