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The Global ETD Search service is a free service for researchers
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Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
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Showing 121 to 130 of 134 (0.011 seconds)| 121 |
3D shape measurements with a single interferometric sensor for insitu lathe monitoringKuschmierz, R., Huang, Y., Czarske, J., Metschke, S., Löffler, F., Fischer, A. 29 August 2019 (has links)
Temperature drifts, tool deterioration, unknown vibrations as well as spindle play are major effects which decrease the achievable precision of computerized numerically controlled (CNC) lathes and lead to shape deviations between the processed work pieces. Since currently no measurement system exist for fast, precise and insitu 3d shape monitoring with keyhole access, much effort has to be made to simulate and compensate these effects. Therefore we introduce an optical interferometric sensor for absolute 3d shape measurements, which was integrated into a working lathe. According to the spindle rotational speed, a measurement rate of 2,500 Hz was achieved. In-situ absolute shape, surface profile and vibration measurements are presented. While thermal drifts of the sensor led to errors of several µm for the absolute shape, reference measurements with a coordinate machine show, that the surface profile could be measured with an uncertainty below one micron. Additionally, the spindle play of 0.8 µm was measured with the sensor.
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Measurement of surface topographies in the nm-range for power chip technologies by a modified low-coherence interferometerTaudt, Ch., Baselt, T., Nelsen, B., Aßmann, H., Greiner, A., Koch, E., Hartmann, P. 29 August 2019 (has links)
This work introduces a modified low-coherence interferometry approach for nanometer surface-profilometry. The key component of the interferometer is an element with known dispersion which defines the measurement range as well as the resolution. This dispersive element delivers a controlled phase variation which can be detected in the spectral domain and used to reconstruct height differences on a sample. In the chosen setup, both axial resolution and measurement range are tunable by the choice of the dispersive element.
The basic working principle was demonstrated by a laboratory setup equipped with a supercontinuum light source (Δλ = 400 ̶ 1700 nm). Initial experiments were carried out to characterize steps of 101 nm on a silicon height standard. The results showed that the system delivers an accuracy of about 11.8 nm. These measurements also served as a calibration for the second set of measurements. The second experiment consisted of the measurement of the bevel of a silicon wafer. The modified low-coherence interferometer could be utilized to reproduce the slope on the edge within the previously estimated accuracy. The main advantage of the proposed measurement approach is the possibility to collect data without the need for mechanically moving parts.
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Two-dimensional low-coherence interferometry for the characterization of nanometer wafer topographiesTaudt, Ch., Baselt, T., Nelsen, B., Aßmann, H., Greiner, A., Koch, E., Hartmann, P. 30 August 2019 (has links)
Within this work a scan-free, low-coherence interferometry approach for surface profilometry with nm-precision is presented. The basic setup consist of a Michelson-type interferometer which is powered by a supercontinuum light-source (Δλ = 400 - 1700 nm). The introduction of an element with known dispersion delivers a controlled phase variation which can be detected in the spectral domain and used to reconstruct height differences on a sample. In order to enable scan-free measurements, the interference signal is spectrally decomposed with a grating and imaged onto a two-dimensional detector. One dimension of this detector records spectral, and therefore height information, while the other dimension stores the spatial position of the corresponding height values.
In experiments on a height standard, it could be shown that the setup is capable of recording multiple height steps of 101 nm over a range of 500 µm with an accuracy of about 11.5 nm. Further experiments on conductive paths of a micro-electro-mechanical systems (MEMS) pressure sensor demonstrated that the approach is also suitable to precisely characterize nanometer-sized structures on production-relevant components. The main advantage of the proposed measurement approach is the possibility to collect precise height information over a line on a surface without the need for scanning. This feature makes it interesting for a production-accompanying metrology.
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Application of satellite radar interferometry in study of the relation between surface deformation and seismic event of the 15th September 2018 in the Rudna copper mine, PolandOwczarz, Karolina, Blachowski, Jan 16 July 2019 (has links)
The phenomenon of induced seismicity is caused by anthropogenic activity such as: underground and opencast mining, extraction of conventional and unconventional hydrocarbons, construction of water reservoirs and production of geothermal energy. In recent years, interest in induced seismicity increased due to the fact that it causes increasingly stronger earthquakes, even above 4 on the Richter scale. Thus, it poses a threat to people, technical and urban infrastructure. This study analyzed the seismic event of M = 4.6, which occurred on the 15 September 2018 in the Rudna copper mine area in SW Poland. For this purpose, Sentinel 1 satellite data and DInSAR processing method were used to determine the ground movement values in the satellite line of sight. Based on the results for four image pairs, the area disturbed by the seismic event was determined. The maximum values of subsidence ranged from -65 mm to -75 mm depending on the analysed dataset and the area of deformation was determined at approx. 4 km sq. The results indicate the usefulness of the adopted method to determine ground deformation caused by induced seismicity in an underground mining area.
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Brilliant radiation sources by laser-plasma accelerators and optical undulatorsDebus, Alexander 17 July 2012 (has links) (PDF)
This thesis investigates the use of high-power lasers for synchrotron radiation sources with high brilliance, from the EUV to the hard X-ray spectral range. Hereby lasers accelerate electrons by laser-wakefield acceleration (LWFA), act as optical undulators, or both. Experimental evidence shows for the first time that LWFA electron bunches are shorter than the driving laser and have a length scale comparable to the plasma wavelength. Furthermore, a first proof of principle experiment demonstrates that LWFA electrons can be exploited to generate undulator radiation.
Building upon these experimental findings, as well as extensive numerical simulations of Thomson scattering, the theoretical foundations of a novel interaction geometry for laser-matter interaction are developed. This new method is very general and when tailored towards relativistically moving targets not being limited by the focusability (Rayleigh length) of the laser, while it does not require a waveguide.
In a theoretical investigation of Thomson scattering, the optical analogue of undulator radiation, the limits of Thomson sources in scaling towards higher peak brilliances are highlighted. This leads to a novel method for generating brilliant, highly tunable X-ray sources, which is highly energy efficient by circumventing the laser Rayleigh limit through a novel traveling-wave Thomson scattering (TWTS) geometry. This new method suggests increases in X-ray photon yields of 2-3 orders of magnitudes using existing lasers and a way towards efficient, optical undulators to drive a free-electron laser.
The results presented here extend far beyond the scope of this work. The possibility to use lasers as particle accelerators, as well as optical undulators, leads to very compact and energy efficient synchrotron sources. The resulting monoenergetic radiation of high brilliance in a range from extreme ultraviolet (EUV) to hard X-ray radiation is of fundamental importance for basic research, medical applications, material and life sciences and is going to significantly contribute to a new generation of radiation sources and free-electron lasers (FELs).
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Brilliant radiation sources by laser-plasma accelerators and optical undulators / Brilliante Strahlungsquellen durch Laser-Plasma Beschleuniger und optische UndulatorenDebus, Alexander 15 October 2012 (has links) (PDF)
Die vorliegende Arbeit beschäftigt sich in Experiment und Theorie mit Laser-Plasma beschleunigten Elektronen und optischen Undulatoren zur Erzeugung von brillianter Synchrotronstrahlung. Zum ersten Mal wird experimentell nachgewießen, dass laserbeschleunigte Elektronenpulse kürzer als 30 fs sind. Ferner werden solche Elektronenpulse erstmalig in einem Demonstrationsexperiment durch einen magnetischen Undulator als Synchrotronstrahlenquelle genutzt.
Aufbauend auf diesen experimentellen Erkenntnissen, sowie umfangreichen numerischen Simulationen zur Thomsonstreuung, werden die theoretischen Grundlagen einer neuartigen Interaktionsgeometrie für Laser-Materie Wechselwirkungen entwickelt. Diese neue, in der Anwendbarkeit sehr allgemeine Methode basiert auf raum-zeitlicher Laserpulsformung durch nichtlineare Winkeldispersion wie diese durch VLS- (varied-line spacing) Gitter erzeugt werden kann und hat den Vorteil nicht durch die Fokussierbarkeit des Lasers (Rayleighlänge) begrenzt zu sein. Zusammen mit laserbeschleunigten Elektronen ermöglicht dieser traveling-wave Thomson scattering (TWTS) benannte Ansatz neuartige, nur auf optischer Technologie basierende Synchrotronstrahlenquellen mit Zentimeter bis Meter langen optische Undulatoren. Die hierbei mit existierenden Lasern erzielbaren Brillianzen übersteigen diese bestehender Thomsonquellen-Designs um 2-3 Größenordnungen.
Die hier vorgestellten Ergebnisse weisen weit über die Grenzen der vorliegenden Arbeit hinaus. Die Möglichkeit Laser als Teilchenbeschleuniger und auch optischen Undulator zu verwenden führt zu bauartbedingt sehr kompakten und energieeffizienten Synchrotronstrahlungsquellen. Die hieraus resultierende monochromatische Strahlung hoher Brillianz in einem Wellenlängenbereich von extremen ultraviolett (EUV) zu harten Röntgenstrahlen ist für die Grundlagenforschung, medizinische Anwendungen, Material- und Lebenswissenschaften von fundamentaler Bedeutung und wird maßgeblich zu einer neuen Generation ultrakurzer Strahlungsquellen und freien Elektronenlasern (FELs) beitragen. / This thesis investigates the use of high-power lasers for synchrotron radiation sources with high brilliance, from the EUV to the hard X-ray spectral range. Hereby lasers accelerate electrons by laser-wakefield acceleration (LWFA), act as optical undulators, or both. Experimental evidence shows for the first time that LWFA electron bunches are shorter than the driving laser and have a length scale comparable to the plasma wavelength. Furthermore, a first proof of principle experiment demonstrates that LWFA electrons can be exploited to generate undulator radiation.
Building upon these experimental findings, as well as extensive numerical simulations of Thomson scattering, the theoretical foundations of a novel interaction geometry for laser-matter interaction are developed. This new method is very general and when tailored towards relativistically moving targets not being limited by the focusability (Rayleigh length) of the laser, while it does not require a waveguide.
In a theoretical investigation of Thomson scattering, the optical analogue of undulator radiation, the limits of Thomson sources in scaling towards higher peak brilliances are highlighted. This leads to a novel method for generating brilliant, highly tunable X-ray sources, which is highly energy efficient by circumventing the laser Rayleigh limit through a novel traveling-wave Thomson scattering (TWTS) geometry. This new method suggests increases in X-ray photon yields of 2-3 orders of magnitudes using existing lasers and a way towards efficient, optical undulators to drive a free-electron laser.
The results presented here extend far beyond the scope of this work. The possibility to use lasers as particle accelerators, as well as optical undulators, leads to very compact and energy efficient synchrotron sources. The resulting monoenergetic radiation of high brilliance in a range from extreme ultraviolet (EUV) to hard X-ray radiation is of fundamental importance for basic research, medical applications, material and life sciences and is going to significantly contribute to a new generation of radiation sources and free-electron lasers (FELs).
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Lokalisation und Volumenberechnung von femoralem Schaftabrieb an explantierten, zementierten Hüftendoprothesenschäften vom Typ CF-30 und dessen Relevanz als Faktor der aseptischen Lockerung / Localisation and volume-calculation of femoral stem wear of explanted, cemented total-hip-replacement-stems of CF-30 type and its relevance as factor of the aseptic looseningStauch, Tilo 09 October 2012 (has links)
No description available.
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Brilliant radiation sources by laser-plasma accelerators and optical undulatorsDebus, Alexander January 2012 (has links)
This thesis investigates the use of high-power lasers for synchrotron radiation sources with high brilliance, from the EUV to the hard X-ray spectral range. Hereby lasers accelerate electrons by laser-wakefield acceleration (LWFA), act as optical undulators, or both. Experimental evidence shows for the first time that LWFA electron bunches are shorter than the driving laser and have a length scale comparable to the plasma wavelength. Furthermore, a first proof of principle experiment demonstrates that LWFA electrons can be exploited to generate undulator radiation.
Building upon these experimental findings, as well as extensive numerical simulations of Thomson scattering, the theoretical foundations of a novel interaction geometry for laser-matter interaction are developed. This new method is very general and when tailored towards relativistically moving targets not being limited by the focusability (Rayleigh length) of the laser, while it does not require a waveguide.
In a theoretical investigation of Thomson scattering, the optical analogue of undulator radiation, the limits of Thomson sources in scaling towards higher peak brilliances are highlighted. This leads to a novel method for generating brilliant, highly tunable X-ray sources, which is highly energy efficient by circumventing the laser Rayleigh limit through a novel traveling-wave Thomson scattering (TWTS) geometry. This new method suggests increases in X-ray photon yields of 2-3 orders of magnitudes using existing lasers and a way towards efficient, optical undulators to drive a free-electron laser.
The results presented here extend far beyond the scope of this work. The possibility to use lasers as particle accelerators, as well as optical undulators, leads to very compact and energy efficient synchrotron sources. The resulting monoenergetic radiation of high brilliance in a range from extreme ultraviolet (EUV) to hard X-ray radiation is of fundamental importance for basic research, medical applications, material and life sciences and is going to significantly contribute to a new generation of radiation sources and free-electron lasers (FELs).
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Untersuchung photorefraktiver Materialien mittels optischer Ptychographie / Investigation of photorefractive materials using optical ptychographyBernert, Constantin 05 January 2017 (has links) (PDF)
In der vorliegenden Arbeit wird die neuartige Mikroskopiemethode der Ptychographie für die Untersuchung photorefraktiver Materialien genutzt. Photorefraktive Materialien zeichnen sich durch die Generation lichtinduzierter Brechungsindexänderungen aus. Die Ptychographie bietet die Möglichkeit, neben der generierten Brechungsindexänderung im photorefraktiven Material auch die für die Generation genutzte Intensitätsverteilung des Laserstrahls zu bestimmen. Es wird sowohl die Abhängigkeit der Brechungsindexänderung von der Zeit der Generation als auch die Abhängigkeit von der Polarisation des Lasers gemessen. Durch den Vergleich der gewonnenen Werte mit einer numerischen Simulation des photorefraktiven Effekts werden mikroskopische Parameter der lichtinduzierten Ladungswanderung ermittelt. Zudem wird aus der polarisationsabhängigen ptychographischen Messung das Raumladungsfeld und die korrespondierende Ladungsdichte im Material berechnet. Die Ptychographie liefert damit einen neuen Zugang zum quantitativen Verständnis der Photorefraktivität. / In the present thesis the novel microscopy technique of ptychography is applied to the investigation of photorefractive materials. Photorefractive materials exhibit a change of the refractive index due to the exposure to light. The method of ptychography determines the refractive index change of the material together with the intensity distribution of the laser beam that was used for its generation. In one part of the experiment the time dependence of the refractive index change versus the generation time is investigated, in the other part of the experiment the dependence of the refractive index change to the polarisation of the laser beam is examined. Microscopic parameters of the photorefractive charge migration are determined with the utilisation of a numerical simulation of the photorefractive effect and its comparison with the measurement. Finally, the whole space charge field with the corresponding space charge density is calculated from a set of ptychographic measurements of one refractive index change with different polarisation directions of the laser. The presented experiments and their evaluation show, that the method of ptychography opens a new possibility for a quantitative understanding of the photorefractive effect.
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Untersuchung photorefraktiver Materialien mittels optischer PtychographieBernert, Constantin 04 October 2016 (has links)
In der vorliegenden Arbeit wird die neuartige Mikroskopiemethode der Ptychographie für die Untersuchung photorefraktiver Materialien genutzt. Photorefraktive Materialien zeichnen sich durch die Generation lichtinduzierter Brechungsindexänderungen aus. Die Ptychographie bietet die Möglichkeit, neben der generierten Brechungsindexänderung im photorefraktiven Material auch die für die Generation genutzte Intensitätsverteilung des Laserstrahls zu bestimmen. Es wird sowohl die Abhängigkeit der Brechungsindexänderung von der Zeit der Generation als auch die Abhängigkeit von der Polarisation des Lasers gemessen. Durch den Vergleich der gewonnenen Werte mit einer numerischen Simulation des photorefraktiven Effekts werden mikroskopische Parameter der lichtinduzierten Ladungswanderung ermittelt. Zudem wird aus der polarisationsabhängigen ptychographischen Messung das Raumladungsfeld und die korrespondierende Ladungsdichte im Material berechnet. Die Ptychographie liefert damit einen neuen Zugang zum quantitativen Verständnis der Photorefraktivität.:1 Einleitung
2 Theoretische Vorbetrachtungen
2.1 Ptychographie
2.1.1 Messung
2.1.2 Modell und Rekonstruktion
2.1.3 Ortsauflösung
2.2 Photorefraktiver Efekt
2.2.1 Lithiumniobat - Musterbeispiel für die Photorefraktivität
2.2.2 Ein-Zentrum-Modell
2.2.3 Brechungsindexänderung
2.2.4 Hohe Intensitäten
2.3 Raumladungsfeld
2.3.1 Ableitung des Feldes aus den Messgrößen
2.3.2 Raumladungsverteilung
2.3.3 Oberflächendeformation
2.3.4 Dynamik der Ladungen und des Feldes
3 Messungen
3.1 Proben
3.1.1 Ptychographische Teststruktur
3.1.2 LiNbO3:Fe
3.2 Versuchsanordnung
3.2.1 Experimenteller Aufbau
3.2.2 Grenze der Ortsauflösung
3.2.3 Charakterisierung des Laserstrahls
3.2.4 Experimentelle Überprüfung der Näherungen
3.3 Dynamik der Brechungsindexänderung
3.4 Polarisationsabhängigkeit der Brechungsindexänderung
4 Auswertung
4.1 Dynamik des Raumladungsfeldes und der Ladungen
4.1.1 Simulation
4.1.2 Vergleich zwischen Messung und Simulation
4.1.3 Dynamik der Ladungsverteilung
4.1.4 Fazit
4.2 Berechnung des Raumladungsfeldes
4.2.1 Raumladungsfeld und Ladungsverteilung
4.2.2 Simulation
4.2.3 Asymmetrie der Ladungsverteilung
4.2.4 Fazit
5 Zusammenfassung
Appendizes
A Physikalische Konstanten
B Tensoren für LiNbO3
C Ungenäherte Herleitung der Brechungsindexänderung
D Implementierung eines iterativen Verfahrens zur Bestimmung der Dynamik
des Ein-Zentrum-Modells
E Quelltext der Implementierung des iterativen Verfahrens
Literaturverzeichnis / In the present thesis the novel microscopy technique of ptychography is applied to the investigation of photorefractive materials. Photorefractive materials exhibit a change of the refractive index due to the exposure to light. The method of ptychography determines the refractive index change of the material together with the intensity distribution of the laser beam that was used for its generation. In one part of the experiment the time dependence of the refractive index change versus the generation time is investigated, in the other part of the experiment the dependence of the refractive index change to the polarisation of the laser beam is examined. Microscopic parameters of the photorefractive charge migration are determined with the utilisation of a numerical simulation of the photorefractive effect and its comparison with the measurement. Finally, the whole space charge field with the corresponding space charge density is calculated from a set of ptychographic measurements of one refractive index change with different polarisation directions of the laser. The presented experiments and their evaluation show, that the method of ptychography opens a new possibility for a quantitative understanding of the photorefractive effect.:1 Einleitung
2 Theoretische Vorbetrachtungen
2.1 Ptychographie
2.1.1 Messung
2.1.2 Modell und Rekonstruktion
2.1.3 Ortsauflösung
2.2 Photorefraktiver Efekt
2.2.1 Lithiumniobat - Musterbeispiel für die Photorefraktivität
2.2.2 Ein-Zentrum-Modell
2.2.3 Brechungsindexänderung
2.2.4 Hohe Intensitäten
2.3 Raumladungsfeld
2.3.1 Ableitung des Feldes aus den Messgrößen
2.3.2 Raumladungsverteilung
2.3.3 Oberflächendeformation
2.3.4 Dynamik der Ladungen und des Feldes
3 Messungen
3.1 Proben
3.1.1 Ptychographische Teststruktur
3.1.2 LiNbO3:Fe
3.2 Versuchsanordnung
3.2.1 Experimenteller Aufbau
3.2.2 Grenze der Ortsauflösung
3.2.3 Charakterisierung des Laserstrahls
3.2.4 Experimentelle Überprüfung der Näherungen
3.3 Dynamik der Brechungsindexänderung
3.4 Polarisationsabhängigkeit der Brechungsindexänderung
4 Auswertung
4.1 Dynamik des Raumladungsfeldes und der Ladungen
4.1.1 Simulation
4.1.2 Vergleich zwischen Messung und Simulation
4.1.3 Dynamik der Ladungsverteilung
4.1.4 Fazit
4.2 Berechnung des Raumladungsfeldes
4.2.1 Raumladungsfeld und Ladungsverteilung
4.2.2 Simulation
4.2.3 Asymmetrie der Ladungsverteilung
4.2.4 Fazit
5 Zusammenfassung
Appendizes
A Physikalische Konstanten
B Tensoren für LiNbO3
C Ungenäherte Herleitung der Brechungsindexänderung
D Implementierung eines iterativen Verfahrens zur Bestimmung der Dynamik
des Ein-Zentrum-Modells
E Quelltext der Implementierung des iterativen Verfahrens
Literaturverzeichnis
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