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Comparison of methods for generation of absolute reflectance factor measurement for BRDF studies /Feng, Xiaofan. January 1990 (has links)
Thesis (M.S.)--Rochester Institute of Technology, 1990. / Includes bibliographical references (leaves 108-111).
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Experimental and analytical characterization of bidirectional reflectance data for engineering materialsZaworski, Joseph Robert 05 May 1994 (has links)
Bidirectional reflectance is a fundamental property
used for the analysis of radiative heat transfer. It is a
form of reflectivity in which the spectral and directional
dependencies of both the beam incident on a surface and the
beam reflected from the surface are specified.
A new system has been designed expressly for measuring
bidirectional reflectance of engineering materials. This
apparatus features a unique goniometer design in which the
source is fixed, the sample is rotated to change the
incident beam directions, and the sensor (which moves with
the sample) is rotated about the sample to change the
measured reflected beam direction.
The system was used to measure the bidirectional
reflectance of a surface consisting of flat-white paint on
an aluminum substrate. The data for this quasi-diffuse
surface were taken over a non-uniform grid. Algorithms are
presented for interpolating and reporting values on a
uniform grid which is appropriate for use in numerical
radiative transfer codes.
Bidirectional reflectance data can be used in the form
of a look-up table although storage requirements will be
large and resolution will be limited by grid resolution.
Alternatively, the data can be modeled as continuous
functions of the incident beam angle. A simple model of
reflectance as the sum of a diffuse and a specular
component is described. A second model with a diffuse
component and a quasi-specular component is also presented
which includes spread in both the polar and azimuthal
directions. Both models are continuous and are based on
curve fits to the data. / Graduation date: 1994
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Thermoreflectance of amorphous GeTeKottke, Michael Lee, 1947- January 1974 (has links)
No description available.
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Multichannel analysis of object-color spectra /Seitz Vent, Debra S. January 1994 (has links)
Thesis (M.S.)--Rochester Institute of Technology, 1994. / Typescript. Includes bibliographical references (leaves 168-171).
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Measuring the effects of soil parameters on bidirectional reflectance distribution functionPradhan, Pushkar Shrikant. January 2001 (has links)
Thesis (M.S.)--Mississippi State University. Department of Electrical and Computer Engineering. / Title from title screen. Includes bibliographical references.
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Infrared diffuse reflectance spectroscopyIbbett, R. N. January 1988 (has links)
No description available.
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Optical Characterizations for Metamorphic Quantum Dots Grown on GaAs substrateChen, Shiang-Lin 09 July 2009 (has links)
Metamorphic multiple quantum dots (QDs) on GaAs substrates were grown by molecular beam epitaxy (MBE). The metamorphic layers including In0.15Ga0.85As and AlAs were in-situ annealed at high temperature (T=800oC) to reduce the dislocations. InGaAs QDs were then grown on the metamorphic layers.
We use the laser source and pulse voltage to modulate the dielectric constant of the samples in modulation reflectance measurement system. The inner electric field is obtained from the photo-reflectance Franz-Keldysh oscillation (FKO), and the energy transition is analyzed though the photoluminescence (PL), electroluminescence (EL), and photocurrent (PC) spectroscopy.
The electroluminescence wavelength of InAs QDs on metamorphic In0.15Ga0.85As substrate can be push to ~1460 nm. The optimum emission quality is obtained by inserting 3-nm GaAs layer beneath the In0.15Ga0.85As buffer layer. The In0.15Ga0.85As buffer is flatter because of the GaAs layer, and the QDs become more uniform. We expect the InAs QDs on metamorphic GaAs substrate can be applied for optical communication in the £f=1550 nm region.
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Hyper-spectral diffuse reflectance spectroscopy imaging towards the identification of non-melanoma skin cancersBish, Sheldon Floyd 11 July 2014 (has links)
Non-melanoma skin cancer is the most prevalent malignancy in the world, with over a million annual positive diagnoses in the United States. If left untreated, these cancers cause morbidity and in rare cases, can become life threatening. The key to identifying and characterizing these tumors in the earliest stages, where they are most treatable lie in margin delineation in order to prevent recurrence. The visual obscurity of tumor morphology and physiology can make early detection a difficult task for dermatologists, particularly in the initial stages of cancer development. Tumor resection is a common course of action once they are discovered; however, there is a high recurrence rate due to incomplete removal of the malignant tissue. This dissertation presents an imaging system that can capture the spectral signatures correlating with morphological and physiological changes that accompany skin dysplasia. With this system, we may improve tumor margin delineation, reducing the number of incomplete tumor biopsies and false negative screenings. As an initial step of this process, we begin with a non-contact point sampling diffuse reflectance probe that mitigates the adverse effects of traditional contact probing. Validation of this probe is performed using tissue simulating phantoms spanning a biologically relevant range of optical and physiological properties to ensure that the non-contact format will not hinder performance relative to the contact probe. Cross polarization and auto-focus mechanisms were included in the design to reduce specular reflections and movement artifacts from in vivo measurements. This non-contact design was further developed into a platform for investigating the role of sampling geometry on diffuse reflectance measurements with the addition of a DMD spatial filter. Finally, we developed a hyperspectral DRSi system for the acquisition of wide-field maps of optical and physiological properties that is currently being tested on patients undergoing skin cancer screenings. The spectral output of this system has been validated for scattering and absorption across biologically relevant ranges using tissue simulating phantoms. The DRSi system was optimized for portability, ergonomics and resolution. / text
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DEVELOPMENT OF A SPECTROMETER FOR THE ELECTROREFLECTANCE SPECTROSCOPY OF METALSRancourt, James Daniel, 1941- January 1974 (has links)
No description available.
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Vitamin assay by means of ultraviolet reflectance spectroscopyLieu, Van Tune January 1966 (has links)
Typescript. / Thesis (Ph. D.)--University of Hawaii, 1966. / Bibliography: leaves [92]-94. / ix, 94 l illus., tables
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