Ph.D. thesis is focused on the study and determination of layer thickness and optical properties, such as the dispersion dependence of the refractive index of various materials prepared in the form of thin layer. In the first part of this work the theoretical findings in the field of spectroscopic ellipsometry are summarised. These findings are followed by the description and characterization of the light polarization, evaluation of experimental data and determination of the physical properties of studied materials. Experimental and result section of this work is devoted to the preparation and characterization of thin films of the studied materials: titanum dioxide (TiO2), new organic materials (MDMO-PPV, PCDTBT, PCBTDPP, PC60BM, PC70BM) and reduced graphene oxide (rGO). These were all selected with respect to their potential use in the organic photovoltaics.