NDLTD Global ETD Search
  • Refine Query
  • Source
  • Publication year
  • to
  • Language
  • No language data
  • Tagged with
  • 1
  • 1
  • 1
  • 1
  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

Search results

Showing 1 to 1 of 1 (0.027 seconds)

Spelling suggestions: "subject:"curculio"" "subject:"curtcircuit""

1

An assessment of supply current measurement (IDDQ) as a reliability indicator for CMOS integrated circuits

Richardson, A. M. D. January 1991 (has links)
No description available.
621.3192
Integrated curcuit testing

Page generated in 0.0312 seconds