Tomographic analysis produces 3D images of examined material in nanoscale by focus ion beam (FIB). This thesis presents new approach to elimination of the curtain effect by machine learning method.  Convolution neuron network is proposed for elimination of damaged imagine by the supervised learning technique. Designed network deals with features of damaged image, which are caused by wavelet transformation. The outcome is visually clear image. This thesis also designs creation of synthetic data set for training the neuron network which are created by simulating physical process of the creation of the real image. The simulation is made of creation of examined material by milling which is done by FIB and by process displaying of the surface by electron microscope (SEM). This newly created approach works precisely with real images. The qualitative evaluation of results is done by amateurs and experts of this problematic. It is done by anonymously comparing this solution to another method of eliminating curtaining effect. Solution presents new and promising approach to elimination of curtaining effect and contributes to a better procedure of dealing with images which are created during material analysis.