The present work reports the experimental evidence of anomalous energy loss, energy straggling, and the corresponding ion-induced electron emission yields of channeled protons in silicon.

The electron emission characteristics of aluminum, molybdenum and carbon nanotubes were studied. The experiments were setup to study the emission behavior as a function of temperature and exposure to oxygen. Changes in the surface work function as a result of thermal annealing were monitored with low energy ultra-violet photoelectron spectroscopy for flat samples while field emission energy distributions were used on tip samples. The change in the field emission from fabricated single tips exposed to oxygen while in operation was measured using simultaneous Fowler-Nordheim plots and electron energy distributions. From the results a mechanism for the degradation in the emission was concluded. Thermal experiments on molybdenum and aluminum showed that these two materials can be reduced at elevated temperatures, while carbon nanotubes on the other hand show effects of oxidation. To purely reduce molybdenum a temperature in excess of 750 ºC is required. This temperature exceeds that allowed by current display device technology. Aluminum on the other hand shows reduction at a much lower temperature of at least 125 ºC; however, its extreme reactivity towards oxygen containing species produces re-oxidation. It is believed that this reduction is due to the outward diffusion of aluminum atoms through the oxide. Carbon nanotubes on the other hand show signs of oxidation as they are heated above 700 ºC. In this case the elevated temperatures cause the opening of the end caps allowing the uptake of water. Oxygen exposure experiments indicate that degradation in field emission is two-fold and is ultimately dependent on the emission current at which the tip is operated. At low emission currents the degradation is exclusively due to oxidation. At high emission currents ion bombardment results in the degradation of the emitter. In between the two extremes, molybdenum tips are capable of stable emission.

Orientador: Marco Antonio Robert Alves / Dissertação (mestrado) - Universidade Estadual de Campinas, Faculdade de Engenharia Eletrica e de Computação / Made available in DSpace on 2018-08-09T17:44:13Z (GMT). No. of bitstreams: 1 Tirolli_MarceloNogueira_M.pdf: 2758197 bytes, checksum: 08f6e633be3e083c0e72c41959dd296d (MD5) Previous issue date: 2007 / Resumo: Este trabalho tem como objetivo o estudo do comportamento elétrico de uma ponteira de emissão de campo, modelada na forma de um hemisfério sobre um poste, através de recursos computacionais (simulações). Escolhemos o software comercial Ansys, que utiliza o método dos elementos finitos nas análises dos fenômenos físicos para obtenção do campo elétrico na superfície da ponteira. Em seguida, foi desenvolvido também um programa computacional que realiza o cálculo da corrente de emissão baseado na teoria de emissão de campo de Fowler-Nordheim (F-N). Para calcular a corrente, o programa faz uso dos resultados das simulações do campo elétrico obtidos no software Ansys. Apresentamos também os resultados da influência que as dimensões como o raio de curvatura do hemisfério, a altura da ponteira e a distância entre anodo e catodo exercem sobre o comportamento do campo elétrico, da corrente de emissão e de outras grandezas físicas que envolvem emissão de campo / Abstract: This work aims to study the electrical behavior of a field emission tip, shaped in the form hemisphere on a post, through computational resources (simulations). We chose the Ansys commercial software that uses the finite element methods in the analyses of the physical phenomena to obtain the electric field in the surface of the tip. After that, a computational program was also developed to perform the calculation of emission current based on Fowler-Nordheim (F-N) field emission theory. To calculate the current, the program uses the results of the electric field simulations gotten in Ansys software. We also show the results of influences that dimensions such as the hemisphere curvature radius, the height of the tip and the distance between anode and cathode exert on the behavior of the electric field, emission current and other physical quantities that involve field emission / Mestrado / Eletrônica, Microeletrônica e Optoeletrônica / Mestre em Engenharia Elétrica

Thesis: B.S., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1978 / Includes bibliographical references. / by Patricia E. Clark. / B.S. / B.S. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science