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M.Ing. (Electrical & Electronic Engineering) / Please refer to full text to view abstract

This dissertation addresses two major issues associated with a built-in self-test environment: (1) how to measure whether a given test vector generator is suitable for testing faults with sequential behavior, and (2) how to measure the safety of self-checking circuits. Measuring the two-vector transition capability for a given test vector generator is a key to the selection of the generators for stimulating sequential faults. The dissertation studies general properties for the transitions and presents a novel, comprehensive analysis for the linear feedback shift registers and the linear hybrid cellular automata. As a result, the analysis solves the open problem as to “how to properly separate the inputs when the LHCA-based generator is used for detecting delay faults”. In general, a self-checking circuit has additional hardware redundancy than the original circuit and as a result, the self-checking circuit may have a higher failure rate than the original one. The dissertation proposes a fail-safe evaluation to predict the probability of the circuit not being in the fail-state. Compared with existing evaluation methods, the fail-safe evaluation is more practical because it estimates the safety of the circuit, which is decreasing as time goes on, instead of giving a constant probability measure. Various other results about improving fault coverage for transition delay faults and testing in macro-based combinational circuits are derived as well. / Graduate

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This thesis describes the design and development of a sampling-type function generator and a four-quadrant analog multiplier. The project is divided into two parts, the general arrangement and circuitry of the function generator and multiplier, and the timing circuits which actuate them. This thesis is concerned with the general circuitry. The functions to be generated are photographed on 35 mm. film and mounted in standard frames which are then fastened to the rim of a rotating disk. An optical system is used to scan the functions in a time-sequential manner. A timing system selects the required abscissa and actuates a combination of electronic gates and clamping circuits which stores the voltage, Eք, representing the ordinate, and the voltage, Eм, representing the maximum of the function. These two stored voltages, Eք and Eм, are applied to separate sweep circuits which produce sweep outputs of EքN(t) and EмN(t) respectively. A system of comparator circuits and gates samples the EքN(t) at the instant a reference voltage, E, equals the sweep EмN(t). Since the sweeps, N(t) are identical, the value of EքN(t) at the instant of sampling is (formula not included). This sequence of operations occurs for each function as it is scanned. Each successive multiplication is stored in its own storage unit. All the circuits are designed to be self-calibrating to minimize error due to drift. / Applied Science, Faculty of / Electrical and Computer Engineering, Department of / Graduate

Master of Science

The objective of this thesis was the design of a regeneratively cooled, high temperature, clean gas plasma generator facility. This facility was desired to extend the high temperature research capabilities of the Department of Mechanical Engineering.