NDLTD Global ETD Search
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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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1

The Effects of Thermal, Strain, and Neutron Irradiation on Defect Formation in AlGaN/GaN High Electron Mobility Transistors and GaN Schottky Diodes

Lin, Chung-Han 28 August 2013 (has links)
No description available.
Electrical Engineering
Materials Science
Nanotechnology
AlGaN/GaN HEMT
Kelvin force probe microscopy
defect characterization
strain mapping
surface photovoltage spectroscopy
temperature mapping
radiation
Schottky diode
electrical characterization

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