In this thesis, a base for the modeling and analysis of laser guided weapons is constituted. In particular, the effects of several control schemes on the performance of a generic laser guided weapon system are investigated. In this generic model, it is assumed that the velocity pursuit guidance is employed via a velocity aligning seeker as the sole sensor. The laser seeker is modeled experimentally, based on data obtained by conducting a series of tests. The laser reflection is also modeled. Aerodynamic coefficients of the generic geometry are generated by the software Missile Datcom. A nonlinear, six degree of freedom simulation is constructed incorporating 10 Hz laser sensing, velocity pursuit guidance, seeker model, and multiple control schemes. The effects of bang-bang, bang-trail-bang, multiposition and continuous control techniques on weapon performance are investigated for stationary and moving targets under ideal and noisy conditions. Flight characteristics like miss distance, range envelope, impact speed, and time of flight are monitored. Weapon&amp / #8217 / s maneuverability is investigated and the effect of employing a theoretical down sensor on the performance is demonstrated. In the light of simulation results, comparisons between various schemes are carried out, improvements on them and their flight envelopes are emphasized. It is concluded that the multiposition scheme provides a significant performance increase in most delivery types and can be an alternative to the continuous scheme. It is shown that the continuous scheme can achieve longer ranges only if backed up by a down sensor.

The presented doctoral thesis deals with measurements of extremely small sizes in nanometrology using a touch probe, which constitutes a part of a three-coordinate measuring system. It addresses a newly developed method of exact measurements in nanometrology by touch probes. The aim of this work was to expand the measurement options of this device and design a methodology proposal for the measurement of small parts, including the determination of accuracy of measurement of this device when used in nanometrology. The work includes the new methodology for the calculation of uncertainty of measurement, which constitutes a keystone in determining the accuracy of measurement of a accuracy three coordinate measuring system (hereinafter only nano-CMM). The first part of the doctoral thesis analyzes the present situation in the area of evaluation of accuracy of measurement in very accurate length measurements. It defines and describes individual methods implemented in the determination of accuracy of measurement on the instrument nano-CMM. A great emphasis is placed on the methodology of the measurement uncertainty, which draws from the author’s experience as a metrologist working in the laboratories of the Department of Primary nanometrology and technical length, Czech Metrology Institute Brno (hereinafter only CMI Brno). The second part of the doctoral thesis focuses on the determination of accuracy of length measurement in nanometrology, using a large set of measurements that were carried out under the reproducibility and repeatability conditions. There is also described and tested a model procedure utilizing the Monte Carlo method to simulate the measuring system nano-CMM in order to extent the newly created methodology of the measurement of uncertainty using a touch probe on the instrument nano-CMM. A substantial part of this doctoral thesis provides a detailed evaluation of results obtained from experiments that were executed under the repeatability and reproducibility conditions, especially for the purposes of the determination of the uncertainty of measurement. In this doctoral thesis, the uncertainty of measurement is chosen to quantify the accuracy of measurement of the instrument nano-CMM. The final part of this thesis summarizes the knowledge obtained during the scientific research and provides its evaluation. For the methodology used to determine the accuracy of measurement in nanometrology, it also outlines the future development in the area of scientific research, including the practical use in metrological traceability and extremely accurate measurements for customers. Furthermore, it deals with the possible use of other scanning systems compatible with the instrument nano-CMM.