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System implementation, modeling and defects pattern recognition for flip chip solder joint inspection using laser techniquesLiu, Sheng 05 1900 (has links)
No description available.
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Finite element analysis of printed wiring board deformations during thermal cycles involved in the solder masking processMartin, Timothy Lee 05 1900 (has links)
No description available.
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Fundamentals of solder interconnect wettingKang, Suk Chae 05 1900 (has links)
No description available.
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Design of an advanced system for inspection of microelectronic devices and their solder connections using laser-induced virbration techniquesHoward, Turner A. 08 1900 (has links)
No description available.
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Observation and modeling of heterogeneous microstructural evolution in Sn-Pb solderWoodmansee, Michael W. 08 1900 (has links)
No description available.
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Flip chip processing of lead-free solders and halogen-free high density microvia substratesBaynham, Grant Andrew 05 1900 (has links)
No description available.
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Effect of Cu concentration and cooling rate on microstructure of Sn-3.9Ag-XCuAthavale, Saurabh. January 2006 (has links)
Thesis (M.S.M.E.)--State University of New York at Binghamton, Watson School of Engineering and Applied Science, 2006. / Includes bibliographical references.
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Numerical prediction and experimental validation of flip chip solder joint geometry for MEMS applications /Lo, Chi Chuen. January 2008 (has links)
Thesis (Ph.D.)--Hong Kong University of Science and Technology, 2008. / Includes bibliographical references (leaves 149-158). Also available in electronic version.
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Application of artificial neural networks to predict defect levels in wave soldering processesSamant, Purnanand G. January 2007 (has links)
Thesis (M.S.)--State University of New York at Binghamton, Dept. of Systems Science and Industrial Engineering, 2007. / Includes bibliographical references.
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Experimental and numerical study of solder ball joints' reliability at package level & board level /Xu, Zhengjian. January 2009 (has links)
Thesis (M.Phil.)--Hong Kong University of Science and Technology, 2009. / Includes bibliographical references (leaves 99-110).
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