Statistically more test samples obtained from a single chip would give a better picture of the various noise processes present. Increasing the number of samples while testing one chip would however lead to an increase in the testing time, decreasing the overall throughput. The aim of this report is to investigate the detection of non-Gaussian noise (burst noise) in a random set of data with a small number of samples. In order to determine whether a given set of noise samples has non-Gaussian noise processes present, a Chi-Squared ‘Goodness of Fit’ test on a modeled set of random data is presented. A discussion of test methodologies using a single test measurement pass as well as two passes is presented from the obtained simulation results. / text