NDLTD Global ETD Search
  • Refine Query
  • Source
  • Publication year
  • to
  • Language
  • No language data
  • Tagged with
  • 1
  • 1
  • 1
  • 1
  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

Search results

Showing 1 to 1 of 1 (0.232 seconds)
1

Charge trapping instabilities in amorphous silicon/silicon nitride thin film transistors

Hepburn, A. R. January 1988 (has links)
No description available.
530.41
Semiconductor charge trapping

Page generated in 0.3054 seconds