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Studies on field effect transistors with conjugated polymer and high permittivity gate dielectrics using pulsed plasma polymerizationXu, Yifan. January 2005 (has links)
Thesis (Ph. D.)--Ohio State University, 2005. / Title from first page of PDF file. Document formatted into pages; contains xx, 187 p.; also includes graphics (some col.). Includes bibliographical references (p. 174-187). Available online via OhioLINK's ETD Center
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The degradation and time-dependent breakdown of p-type MOSFETS with a high-k dielectric /Yust, Brian. January 1900 (has links)
Thesis (M.S.)--Texas State University-San Marcos, 2008. / Vita. Includes bibliographical references (leaf 77). Also available on microfilm.
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Enhanced hot-hole degradation and negative bias temperature instability (NBTI) in p⁺-poly PMOSFETs with oxynitride gate dielectrics /Chen, Yuh-yue, January 2000 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2000. / Vita. Includes bibliographical references (leaves 158-172). Available also in a digital version from Dissertation Abstracts.
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