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Electrical noise measurements in amorphous silicon films

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:691938
Date January 1986
CreatorsBathaei, F. Z.
PublisherImperial College London
Source SetsEthos UK
Detected LanguageFrench
TypeElectronic Thesis or Dissertation
Sourcehttp://hdl.handle.net/10044/1/37937

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