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Development towards a focus variation based micro-co-ordinate measuring machine

The increasing number of small and fragile parts that are being manufactured using micromachining technology has raised the demand for co-ordinate measurement machines (CMM) that can measure on a micro- and millimetric scale without contacting the part, thus avoiding damage to the surface of the part. These instruments are expected to measure on a micro- and millimetric scale with a measuring uncertainty in the nanometre range. A number of techniques used for contactless surface measurements exist, such as the focus variation (FV) technique, which have the ability to perform measurements on the micro- and millimetric scale in a short amount of time. These instruments may have the potential to be implemented in a non-contact micro-CMM platform.

Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:719177
Date January 2014
CreatorsHiersemenzel, Florine
PublisherLoughborough University
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation
Sourcehttps://dspace.lboro.ac.uk/2134/14920

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