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Compositional depth profiling : maximising spatial resolution through minimising sample damage

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.362041

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:362041
Date	January 1997
Creators	Wilkinson, David K.
Publisher	University of York
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation