Return to search

Scanning Kelvin probe microscopy studies on device physics of organic field-effect transistors

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:709226
Date January 2015
CreatorsHu, Yuanyuan
PublisherUniversity of Cambridge
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

Page generated in 0.0019 seconds