Return to search

Two-carrier charge trapping and dielectric breakdown in thin silicon nitride films /

No description available.

1. http://rave.ohiolink.edu/etdc/view?acc_num=osu1487262825076869

Identifer	oai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:osu1487262825076869
Date	January 1985
Creators	Chang, Ko-Min
Publisher	The Ohio State University / OhioLINK
Source Sets	Ohiolink ETDs
Language	English
Detected Language	English
Type	text
Source	http://rave.ohiolink.edu/etdc/view?acc_num=osu1487262825076869
Rights	unrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.