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Single pattern detection and identification of of CMOS transistor faults, requirements and methods : design and realisation of the OCIMU I←D←D←Q monitor; single pattern CMOS transistor fault testing

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.361497

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:361497
Date	January 1996
Creators	Manhaeve, Hans A. R.
Publisher	University of Hull
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation