Aiming to reduce research and development times in the field of silicon photonics, this paper presents a method for automatized device testing. Focus lies on automatic optical coupling between the grating couplers on a chip and optical fibers and efficient switching between devices when performing laboratory tests on silicon photonic chips. A lab setup with high precision motorized stages has been built and an algorithm for finding the best optical coupling between fiber and chip, based on the light distribution properties of the fiber, has been implemented. The project results shows that, while these methods have the potential of considerable time savings, further testing is needed.
| Identifer | oai:union.ndltd.org:UPSALLA1/oai:DiVA.org:kth-254228 |
| Date | January 2019 |
| Creators | Lundberg, Tommy, Nee, Daniel |
| Publisher | KTH, Skolan för elektroteknik och datavetenskap (EECS) |
| Source Sets | DiVA Archive at Upsalla University |
| Language | English |
| Detected Language | English |
| Type | Student thesis, info:eu-repo/semantics/bachelorThesis, text |
| Format | application/pdf |
| Rights | info:eu-repo/semantics/openAccess |
| Relation | TRITA-EECS-EX ; 2019:130 |
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