Microprocessors are used in many applications where a high degree of reliability is required. For instance, satellite based systems operating in space have no way being serviced if something were goes wrong. Often these systems, operating in radiation environments, are subject to random high energy particles that pass through the device and upset the operation of the microprocessor for a short period but leave no permanent damage. These transient faults are difficult to predict, prevent, or detect but can lead to a system failure if not discovered. / Master of Science
| Identifer | oai:union.ndltd.org:VTETD/oai:vtechworks.lib.vt.edu:10919/45599 |
| Date | 10 November 2009 |
| Creators | Becker, Brian Alan |
| Contributors | Electrical Engineering, Tront, Joseph G., Armstrong, James R., Ha, Dong Sam |
| Publisher | Virginia Tech |
| Source Sets | Virginia Tech Theses and Dissertation |
| Language | English |
| Detected Language | English |
| Type | Thesis, Text |
| Format | x, 146 leaves (some folded), BTD, application/pdf, application/pdf |
| Rights | In Copyright, http://rightsstatements.org/vocab/InC/1.0/ |
| Relation | OCLC# 27871470, LD5655.V855_1993.B435.pdf |
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