Bc. Marek Budiš Comparison of X-ray microtomography possibilities of application in metrology with conventional approaches Master thesis, Institute of production machines, systems and robotics, BUT FME Brno This master thesis is focused on the analysis of metrological possibilities of using computer X-ray microtomography methods in the industry. The work contains a description of the methods, equipment and measurement. Listed are the main advantages of using X-ray tomography in metrology in comparison with coordinate measuring machine. The work deals with the measurement accuracy of microtomography machine GE V|tome|x L 240, analyzing sources of instrument uncertainty and its quantification. The work was also devised a practical table for the calculation of uncertainty of measurement. The practical part was also measuring on real samples of the industry.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:230768 |
| Date | January 2013 |
| Creators | Budiš, Marek |
| Contributors | Pernikář, Jiří, Novotný, Jan |
| Publisher | Vysoké učení technické v Brně. Fakulta strojního inženýrství |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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