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THE MECHANICAL PROPERTIES OF AMORPHOUS SILICON CARBIDE FILMS DEPOSITED BY PECVD AND RF SPUTTERING FOR APPLICATION AS A STRUCTURAL LAYER IN MICROBRIDGE-BASED RF MEMS

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:case1270241057
Date17 May 2010
CreatorsParro, Rocco John, III
PublisherCase Western Reserve University School of Graduate Studies / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageGerman
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=case1270241057
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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