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Espectrometria de raios-x com diodos de Si

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06889.pdf: 2660879 bytes, checksum: 1ad6cb9abd7b6c1a92d40f0b7cb82b55 (MD5) / Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) / Dissertacao (Mestrado) / IPEN/D / Instituto de Pesquisas Energeticas e Nucleares - IPEN/CNEN-SP / FAPESP:97/12485-4

Identiferoai:union.ndltd.org:IBICT/oai:repositorio.ipen.br:123456789/10807
Date09 October 2014
CreatorsMAGALHAES, RODRIGO R. de
ContributorsCarmem Cecilia Bueno Tobias
Source SetsIBICT Brazilian ETDs
Detected LanguagePortuguese
Typeinfo:eu-repo/semantics/publishedVersion, info:eu-repo/semantics/masterThesis
Format79
Sourcereponame:Repositório Institucional do IPEN, instname:Instituto de Pesquisas Energéticas e Nucleares, instacron:IPEN
CoverageN
Rightsinfo:eu-repo/semantics/openAccess

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