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The effects of deposition conditions on the low energy absorption spectrum of microcrystalline silicon thin films prepared by HWCVD method/

Thesis (Master)--İzmir Institute Of Technology, İzmir, 2005. / Keywords: Microcrystalline silicon, absorption, spectroscopy, defect, dual beam photoconductivity. Includes bibliographical references (leaves. 81-86).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/416336869
Date January 2005
CreatorsIşık, Nebile. Güneş, Mehmet
Publisher[s.l.]: [s.n.],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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