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A Monolithic Radiation-Hard Testbed for Timing Characterization of Charge-Sensitive Particle Detector Front-Ends in 28 nm CMOS

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:osu1641540254490753
Date16 August 2022
CreatorsCaisley, Kennedy
PublisherThe Ohio State University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=osu1641540254490753
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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