The primary aim of this thesis was to study the physical effect of energetic deposition on metal thin films. The secondary aim is to enhance the quality of the films produced to a desired quality. Grazing incidence X-ray reflectivity (GIXR) measurements from a high-energy synchrotron radiation source were carried out to study and characterise the samples. Optical Profilers Interferometry, Atomic Force Microscope (AFM), Auger electron spectroscopy (AES), Medium energy ion spectroscopy (MEIS), and the Electron microscope studies were the other main structural characterisation tools used.
| Identifer | oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:392327 |
| Date | January 2001 |
| Creators | Al-Busaidy, Mohamed Said Kahalifa |
| Publisher | Loughborough University |
| Source Sets | Ethos UK |
| Detected Language | English |
| Type | Electronic Thesis or Dissertation |
| Source | https://dspace.lboro.ac.uk/2134/36128 |
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