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Characterisation of nitride thin films by electron backscattered diffraction correlated with cathodoluminescence spectroscopy and imaging

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Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:426303
Date January 2006
CreatorsSweeney, Francis
PublisherUniversity of Strathclyde
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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