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Exploring the potential of ellipsometry for the characterisation of conjugated polymer thin films

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:417270
Date January 2005
CreatorsCampoy Quiles, Mariano
PublisherImperial College London
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation
Sourcehttp://hdl.handle.net/10044/1/8789

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