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Advanced transmission electron microscopy studies in low-energy ion implanted Si

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.251285

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:251285
Date	January 2002
Creators	Wang, Te-Sheng
Publisher	University of Sheffield
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation