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High resolution electron energy loss spectroscopy of narrow gap III V semiconductor surfaces and interfaces

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.252483

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:252483
Date	January 2002
Creators	Veal, Timothy David
Publisher	University of Warwick
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation