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Improved atomic force microscopy based techniques for electrical and structural characterisation of thin dielectric films

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:429694
Date January 2006
CreatorsFrammelsberger, Werner
PublisherUniversity of the West of England, Bristol
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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