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An Investigation of Charge Storage Effects Induced by High Energy Electron Bombardment of Insulated Gate Field Effect Devices

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  1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.469477
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537.622
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Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:469477
Date January 1976
CreatorsPrice, J. C.
PublisherUniversity of London
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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