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A Transmission Electron Microscopy study of the Interaction between Defects in Amorphous Silicon and a Moving Crystalline/Amorphous Interface

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Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:502784
Date January 2008
CreatorsGandy, Amy S.
PublisherUniversity of Salford
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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