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Deductive diagnosis of multiple faults in combinational digital electronic circuits by analysis of critical paths

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.290946

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:290946
Date	January 1991
Creators	Sangwine, S. J.
Publisher	University of Reading
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation