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Expert system technology applied to the testing of complex digital electronic architectures : TEXAS; a synergistic test strategy planning and functional test pattern generation methodology applicable to the design, development and testing of complex digit
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Identifer | oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:234077 |
Date | January 1989 |
Creators | Cosgrove, S. J. |
Publisher | Brunel University |
Source Sets | Ethos UK |
Detected Language | English |
Type | Electronic Thesis or Dissertation |
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