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Testing of digital CMOS integrated circuits : the multidimensional testing paradigm

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.299132

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:299132
Date	January 1998
Creators	Maiuri, Ovidio V.
Publisher	University of Oxford
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation