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Logic circuit testability for reconvergent fan-out nodes

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.374197

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:374197
Date	January 1986
Creators	Roberts, M. W.
Publisher	University of York
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation