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Experimental study on the reliability of strained Si MOSFETs on varied technology platforms

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Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:443988
Date January 2007
CreatorsAgaiby, Rimoon Michael Behnam
PublisherUniversity of Newcastle Upon Tyne
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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