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Flexible embedded test solutions for high-spped analogue front-end circuits

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Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:411888
Date January 2003
CreatorsLechner, Andreas
PublisherLancaster University
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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