NDLTD Global ETD Search
New Search
Return to search
Evaluation of hot-carrier induced degradation in MOSFETs by measurement at cryogenic temperatures
No description available.
Links & Downloads
http://espace.library.uq.edu.au/view/UQ:105559
Tags
660300 Energy Storage and Distribution
Additional Fields
Identifer
oai:union.ndltd.org:ADTP/254399
Creators
Yao, S.
Source Sets
Australiasian Digital Theses Program
Detected Language
English
Page generated in 0.0018 seconds