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Surface Parameter Estimation using Bistatic Polarimetric X-band Measurements

Zugl.: Chemnitz, Techn. Univ., Diss., 2008.

  1. urn:nbn:de:bsz:ch1-200801439
Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/316284156
Date January 2008
CreatorsKhadhra, Kais Ben,
PublisherOberpfaffenhofen [u.a.] : DLR,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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