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Analysis of the reliability of A1GaAs/GaAs HBTs based on device simulation

No description available.

1. https://stars.library.ucf.edu/rtd/1369

Identifer	oai:union.ndltd.org:ucf.edu/oai:stars.library.ucf.edu:rtd-2368
Date	01 April 2001
Creators	Tan, Ying
Publisher	STARS
Source Sets	University of Central Florida
Language	English
Detected Language	English
Type	text
Source	Retrospective Theses and Dissertations