This thesis presents a new architecture of stochastic Analog-to-Digital converter (ADC). A standard Stochastic ADC uses comparator random offset as the trip point while all the comparators have the same reference voltages. Since the offset of a basic comparator depends on a number of independent random variables, the offset will follow randomly distributed Gaussian function. The input dynamic range of this standard stochastic ADC is ±?. For 90nm technology ? value is around 153mV. A technique is presented that converts overall transfer function of a stochastic ADC i.e. Gaussian distribution into almost uniformly distribution with a wider range. With the proposed technique, an input dynamic range of ± 153mV and ENOB of 4bits of standard stochastic ADC are increased to variable input dynamic range of ±250mV to ±500mV and ENOB of 6bits.
Identifer | oai:union.ndltd.org:LACETR/oai:collectionscanada.gc.ca:NSHD.ca#10222/21911 |
Date | 23 April 2013 |
Creators | Ceekala, Mithun |
Source Sets | Library and Archives Canada ETDs Repository / Centre d'archives des thèses électroniques de Bibliothèque et Archives Canada |
Language | English |
Detected Language | English |
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