Characterization of heavy-ion, neutron and alpha particle-induced single-event transient pulse widths in advanced CMOS technologies

Description

Thesis (Ph. D. in Electrical Engineering)--Vanderbilt University, Dec. 2008. / Title from title screen. Includes bibliographical references.

Links & Downloads

1. http://etd.library.vanderbilt.edu/ETD-db/available/etd-11302008-210032/

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/277148291
Date	January 1900
Creators	Narasimham, Balaji.
Source Sets	OCLC
Language	English
Detected Language	English
Type	Electronic dissertations.