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Spectroscopic ellipsometry charactarization of single and multilayer aluminum nitride / indium nitride thin film systems

Thesis (Ph.D.)--Ohio University, June, 2005. / Title from PDF t.p. Includes bibliographical references (p. 221-234)

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/70841564
Date January 2005
CreatorsKhoshman, Jebreel M.
PublisherOhio : Ohio University,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceConnect to resource online

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